STRESS-MEASURING DEVICE FOR MICROTOME, SAMPLE- DETERMINING DEVICE IN MICROTOME, AND STRESS-CALIBRATING METHOD IN MICROTOME

摘要

PROBLEM TO BE SOLVED: To provide a stress-measuring device for a microtome, capable of accurately measuring stress when cutting or applying a force to a sample for preparing a thin slice sample for evaluating a biomaterial and industrial material embedded in an organism, a sample-determining device in a microtome, and a stress-calibrating method.;SOLUTION: An L-shaped stress-transmitting member is mounted to a sample holder, and a sample is fixed to the L-shaped stress-transmitting member. When the sample is moved vertically, the sample is cut into a thin slice by a cutter separately fixed to a mounting base. A highly sensitive force converter is mounted on the sample holder, and the stress exerted on the sample is transmitted to the highly sensitive force converter via the L-shaped stress-transmitting member. The L-shaped stress-transmitting member accurately transmits the stress, when the sample is cut to the highly sensitive force converter according to the principle of leverage.;COPYRIGHT: (C)2001,JPO