首页> 外国专利> METHOD FOR MANUFACTURING OXIDE FERROELECTRIC THIN FILM OXIDE FERROELECTRIC THIN FILM AND OXIDE FERROELECTRIC THIN FILM ELEMENT

METHOD FOR MANUFACTURING OXIDE FERROELECTRIC THIN FILM OXIDE FERROELECTRIC THIN FILM AND OXIDE FERROELECTRIC THIN FILM ELEMENT

机译:氧化铁电薄膜的制造方法氧化铁电薄膜和氧化铁电薄膜元件

摘要

A method of manufacturing an oxide ferroelectric thin film of Bi, Ti and O by an MOCVD method on a substrate having an electrode formed thereon, comprises the step of supplying material gases capable of forming the oxide ferroelectric thin film onto the substrate, wherein an oxygen gas flow rate relative to a total gas flow rate of the material gases is controlled to a value required for obtaining the oxide ferroelectric thin film having a predetermined orientation and/or coercive field, and a flow rate of at least one of the material gases containing constituent elements other than oxygen constituting the oxide ferroelectric thin film is controlled so that a compositional ratio of the constituent elements other than oxygen constituting the oxide ferroelectric thin film is a value required for obtaining the oxide ferroelectric thin film having a predetermined residual polarization and/or relative dielectric constant.
机译:一种通过MOCVD法在其上形成有电极的基板上制造Bi,Ti和O的氧化物铁电薄膜的方法,该方法包括以下步骤:将能够形成氧化物铁电薄膜的原料气体供应到基板上,其中,氧相对于原料气体的总气体流量的气体流量被控制为获得具有预定取向和/或矫顽场的氧化物铁电薄膜所需的值,并且至少一种原料气体的流量被包含在其中。控制构成氧化物铁电薄膜的氧以外的构成元素,使得构成氧化物铁电薄膜的氧以外的构成元素的组成比为获得具有规定的残留极化和/或氧化物的氧化物铁电薄膜所需的值。相对介电常数。

著录项

  • 公开/公告号US2002153543A1

    专利类型

  • 公开/公告日2002-10-24

    原文格式PDF

  • 申请/专利权人 KIJIMA TAKESHI;

    申请/专利号US19990407914

  • 发明设计人 TAKESHI KIJIMA;

    申请日1999-09-29

  • 分类号H01L31/119;H01L29/94;H01L29/76;H01L27/108;

  • 国家 US

  • 入库时间 2022-08-22 00:52:22

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