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Evaluation system for analog-digital or digital-analog converter

机译:用于模数或数模转换器的评估系统

摘要

There is provided an evaluation system for an A-D converter or a D-A converter capable of evaluating factors of a compounded fault and measuring an effective number of bits with a high accuracy and with a reduced volume of computation, independently of a testing frequency. A sine wave signal is applied to an A-D converter under test. Maximal or minimal values of a cosine wave component and a sine wave component in the converted output are aligned. A square root of a sum of squares of samples is formed to determine an instantaneous amplitude. The amplitude of the sine wave signal is interleaved into the series of instantaneous amplitudes. A difference series for the interleaved instantaneous amplitude series is formed by digital moving differentiator means. Alternatively, a Wavelet transform is applied to the interleaved instantaneous amplitude series, and a maximum amplitude therein is detected by a peak finder, and the detected value is delivered as representing an estimated effective number of bits.
机译:提供了一种用于A-D转换器或D-A转换器的评估系统,其能够独立于测试频率而评估复合故障的因数并以高精度和减少的计算量来测量有效位数。正弦波信号被施加到被测A-D转换器。对齐转换后输出中余弦波分量和正弦波分量的最大值或最小值。形成样本平方和的平方根以确定瞬时幅度。正弦波信号的振幅被交错成一系列瞬时振幅。通过数字移动微分器装置形成交错的瞬时振幅序列的差分序列。可替代地,将小波变换应用于交织的瞬时幅度序列,并且由峰值查找器检测其中的最大幅度,并且将检测到的值作为代表估计的有效位数来传送。

著录项

  • 公开/公告号US6476742B2

    专利类型

  • 公开/公告日2002-11-05

    原文格式PDF

  • 申请/专利权人 ADVANTEST CORPORATION;

    申请/专利号US20010925230

  • 发明设计人 TAKAHIRO YAMAGUCHI;

    申请日2001-08-08

  • 分类号H03M11/00;H03M16/60;

  • 国家 US

  • 入库时间 2022-08-22 00:46:56

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