首页> 外国专利> GAS-PHASE ADDITIVES FOR AN ENHANCEMENT OF LATERAL ETCH COMPONENT DURING HIGH DENSITY PLASMA FILM DEPOSITION TO IMPROVE FILM GAP-FILL CAPABILITY

GAS-PHASE ADDITIVES FOR AN ENHANCEMENT OF LATERAL ETCH COMPONENT DURING HIGH DENSITY PLASMA FILM DEPOSITION TO IMPROVE FILM GAP-FILL CAPABILITY

机译:在高密度等离子膜沉积过程中增强侧面蚀刻成分的气相添加剂,以提高膜间隙填充能力

摘要

A method for fabricating a silicon oxide and silicon glass layers atlow temperature using High Density Plasma CVD with silane or inorganic ororganic silane derivatives as a source of silicon, inorganic compoundscontaining boron, phosphorus, and fluorine as a doping compounds, oxygen,and gas additives is described. RF plasma with certain plasma density ismaintained throughout the entire deposition step in reactor chamber. Keyfeature of the invention's process is a silicon source to gas additivemole ratio, which is maintained depending on the used compound anddeposition process conditions. Inorganic halide-containing compounds areused as gas additives. This feature provides the reaction conditions forthe proper reaction performance that allows a deposition of a film withgood film integrity and void-free gap-fill within the steps of devicestructures.
机译:用于制造氧化硅和硅玻璃层的方法使用高密度等离子CVD与硅烷或无机物或有机硅烷衍生物作为硅,无机化合物的来源含有硼,磷和氟作为掺杂化合物,氧,描述了气体添加剂。具有一定等离子体密度的RF等离子体为在反应器腔室中的整个沉积步骤中均保持不变。键本发明方法的特征是硅源为气体添加剂摩尔比,取决于所用化合物和沉积工艺条件。含无机卤化物的化合物是用作气体添加剂。该功能提供了反应条件适当的反应性能,可以使薄膜沉积在设备步骤中具有良好的薄膜完整性和无空隙的间隙填充结构。

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