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ANTIREFLECTION BASE FOR ULTRAVIOLET AND VACUUM ULTRAVIOLET REGIONS

机译:紫外线和真空紫外线区域的抗弯基础

摘要

An antireflection substrate comprising a substrate which is transparent to ultraviolet and vacuum ultraviolet rays in the wavelength region from 155 nm to 200 nm and a mono-, bi- or tri-layer antireflection film formed on at least one side of the substrate, wherein the refractive index and the physical thickness of the antireflection film at the center wavelength λ0 of the wavelength region of ultraviolet or vacuum ultraviolet light which needs antireflection satisfy particular conditions, and an optical component for a semiconductor manufacturing apparatus and a substrate for a low-reflection pellicle which is the ultraviolet and vacuum ultraviolet antireflection substrate.
机译:一种抗反射衬底,包括对波长范围为155nm至200nm的紫外线和真空紫外线透明的衬底,以及在该衬底的至少一侧上形成的单层,双层或三层抗反射膜,其中需要抗反射的紫外线或真空紫外线的波长区域的中心波长λ0处的抗反射膜的折射率和物理厚度满足特定条件,并且用于半导体制造装置的光学部件和用于低反射防护膜的基板它是紫外线和真空紫外线减反射基材。

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