首页> 外国专利> PLASMA TREATMENT DEVICE METHOD FOR TESTING PERFORMANCE OF PLASMA TREATMENT DEVICE OR PLASMA TREATMENT SYSTEM METHOD FOR MAINTAINING THEREOF SYSTEM FOR MANAGING PERFORMANCE AND SYSTEM FOR CHECKING PERFORMANCE

PLASMA TREATMENT DEVICE METHOD FOR TESTING PERFORMANCE OF PLASMA TREATMENT DEVICE OR PLASMA TREATMENT SYSTEM METHOD FOR MAINTAINING THEREOF SYSTEM FOR MANAGING PERFORMANCE AND SYSTEM FOR CHECKING PERFORMANCE

机译:等离子处理装置的性能测试用等离子处理装置方法或等离子处理系统的维护方法,性能检查系统

摘要

PURPOSE: To provide a performance management system for managing the plasma processing apparatus or system located at the customer site to exhibit a required performance and for immediately performing corrective actions when the required performance is not achieved. CONSTITUTION: The plasma processing apparatus includes a plasma processing chamber(CN) having an electrode(4) for exciting a plasma; a radiofrequency generator(1) connected to the electrode; and an impedance matching circuit(2A) for performing the impedance matching between the plasma processing chamber and the radiofrequency generator. The performance of the apparatus is evaluated whether or not three times the first series resonant frequency of the plasma processing chamber is larger than the power frequency supplied to the plasma processing chamber.
机译:目的:提供一种性能管理系统,用于管理位于客户现场的等离子处理设备或系统以显示所需的性能,并在未达到所需的性能时立即执行纠正措施。组成:等离子处理设备包括一个等离子处理室(CN),其具有用于激发等离子的电极(4);连接到电极的射频发生器(1);阻抗匹配电路(2A),用于在等离子体处理室和射频发生器之间进行阻抗匹配。评估设备的性能是否等于等离子体处理室的第一串联谐振频率的三倍大于提供给等离子体处理室的电源频率。

著录项

  • 公开/公告号KR20020023676A

    专利类型

  • 公开/公告日2002-03-29

    原文格式PDF

  • 申请/专利权人 ALPS ELECTRIC CO. LTD.;OHMI TADAHIRO;

    申请/专利号KR20010058870

  • 发明设计人 NAKANO AKIRA;OHMI TADAHIRO;

    申请日2001-09-22

  • 分类号C23C16/00;

  • 国家 KR

  • 入库时间 2022-08-22 00:31:21

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