The test circuit according to the parameters of the I / O including a bidirectional, according to the invention is provided with a logic unit (100) for coupling the I / O in a single test chain. An input buffer (132, 134, 142, 146) and is applied to the pulse moving in the chain to test the switching levels of the output buffers (136, 138, 144, 148). Characteristics of this circuit it is possible to program the interactivity (192-194, 196-198) to the input (test mode 1) or outputs (test mode 2), it is possible to ensure that the input and output buffers of the test circuit. A test mode can be selected by simply written to the data register in which access to the outside.
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