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Fabrication method of self aligned planar buried heterostructure semiconductor laser

机译:自对准平面掩埋异质结构半导体激光器的制备方法

摘要

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to semiconductor technology, and more particularly to semiconductor laser manufacturing technology, and more particularly, to a planar embedded semiconductor laser manufacturing technology of an automatic alignment structure. It is an object of the present invention to provide a method for manufacturing a planar buried semiconductor laser which can replace a mesa side dry and wet etching process, which is a key technology of reliability, with a reproducible process by simplifying process steps. A method of manufacturing a planar buried semiconductor laser of the present invention includes a first step of forming a mask nitride film pattern in which a mesa region is opened on a substrate having a (0-1 1) crystal plane; A second step of epitaxially growing a buffer layer, an active layer, and a first cladding layer which form a resonator in the mesa region using a selective crystal growth technique, wherein the resonator forms a pyramid structure having a (111) B crystal plane at a side thereof; Removing the mask nitride film pattern; And a fourth step of epitaxially growing the current blocking layer, the second cladding layer, and the ohmic contact layer after performing the third step. That is, the present invention is a technology that allows the active layer portion is automatically aligned while eliminating the etching process on the side of the active layer that causes reliability problems by using selective area growth technology, and significantly reduces the semiconductor process including regrowth, Reproducibility and reliability are improved and economical light source fabrication is possible.
机译:自动对准结构的平面嵌入式半导体激光器的制造技术领域本发明涉及半导体技术,尤其涉及一种半导体激光器的制造技术,尤其涉及一种自动对准结构的平面嵌入式半导体激光器的制造技术。本发明的一个目的是提供一种制造平面掩埋半导体激光器的方法,该方法可以通过简化工艺步骤以可再现的工艺来代替作为可靠性关键技术的台面侧干法和湿法刻蚀工艺。本发明的平面埋入式半导体激光器的制造方法包括:第一步,在具有(0-1 1)晶面的基板上形成在台面区域开口的掩模氮化物膜图案。使用选择性晶体生长技术在台面区域中外延生长形成谐振器的缓冲层,有源层和第一覆层的第二步骤,其中谐振器形成具有(111)B晶面的金字塔结构。侧面去除掩模氮化物膜图案;第四步骤是在执行第三步骤后外延生长电流阻挡层,第二覆盖层和欧姆接触层。也就是说,本发明是一种技术,该技术允许有源层部分自动对准,同时通过使用选择性区域生长技术消除了在有源层侧上引起可靠性问题的蚀刻工艺,并显着减少了包括再生长在内的半导体工艺,可重复性和可靠性得到改善,并且经济的光源制造成为可能。

著录项

  • 公开/公告号KR100319774B1

    专利类型

  • 公开/公告日2002-01-05

    原文格式PDF

  • 申请/专利权人 NULL NULL;

    申请/专利号KR19990058691

  • 发明设计人 오대곤;박문호;

    申请日1999-12-17

  • 分类号H01S5/30;H01S5/20;

  • 国家 KR

  • 入库时间 2022-08-22 00:30:02

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