首页> 外国专利> Reaction chamber reconditioning method for CVD reactor, etching reactor, involves introducing mixture of hydrogen and nitrogen gas into chamber that reacts with photoresist layer on dummy wafer

Reaction chamber reconditioning method for CVD reactor, etching reactor, involves introducing mixture of hydrogen and nitrogen gas into chamber that reacts with photoresist layer on dummy wafer

机译:用于CVD反应器,蚀刻反应器的反应室修复方法,涉及将氢气和氮气的混合物引入与虚设晶片上的光刻胶层反应的室中

摘要

The reaction chamber (100) is cleaned by removing high molecular weight microparticles inside a chamber. A dummy wafer having a photoresist layer is placed inside the chamber and mixture of hydrogen and nitrogen gas is introduced into chamber. The gas molecules in the gaseous mixture is allowed to react with photoresist layer on the dummy wafer.
机译:通过去除反应室内的高分子量微粒来清洁反应室(100)。将具有光致抗蚀剂层的伪晶片放置在室内,并将氢气和氮气的混合物引入室内。使气体混合物中的气体分子与伪晶片上的光致抗蚀剂层反应。

著录项

  • 公开/公告号DE10115492A1

    专利类型

  • 公开/公告日2002-10-10

    原文格式PDF

  • 申请/专利权人 PROMOS TECHNOLOGIES INC.;

    申请/专利号DE2001115492

  • 发明设计人 YANG TENG-CHUNG;CHEN CHEN-WEI;

    申请日2001-03-29

  • 分类号H01L21/3065;C23C16/56;C23F4/00;

  • 国家 DE

  • 入库时间 2022-08-22 00:27:00

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