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Monolithically integrated microwave circuit with high electron mobility barrier layer transistor and hetero-transition bipolar transistor and manufacturing process

机译:具有高电子迁移率阻挡层晶体管和异质过渡双极晶体管的单片集成微波电路及其制造工艺

摘要

A highly uniform, planar and high speed JHEMT-HBT MMIC (20) is fabricated using a single growth process. A multi-layer structure including a composite emitter-channel layer, a base-gate layer and a collector layer is grown on a substrate (26). The composite emitter-channel layer (30) includes a sub-emitter/channel layer that reduces the access resistance to the HBT's emitter (34) and the JHEMT's channel (42), thereby improving the HBT's high frequency performance and increasing the JHEMT's current gain. The multi-layer structure is then patterned and metallized to form an HBT collector contact (52, 54, 56), planar HBT base (46, 50) and JHEMT gate (48, 51) contacts, and planar HBT emitter (34) and JHEMT source (36) and drain (38) contacts. IMAGE
机译:使用单个生长过程即可制造出高度均匀,平面且高速的JHEMT-HBT MMIC(20)。在基板(26)上生长包括复合发射极-沟道层,基栅层和集电极层的多层结构。复合发射极通道层(30)包括一个子发射极/通道层,可降低对HBT发射极(34)和JHEMT通道(42)的访问电阻,从而改善HBT的高频性能并增加JHEMT的电流增益。然后对多层结构进行构图和金属化,以形成HBT集电极触点(52、54、56),平面HBT基极(46、50)和JHEMT栅极(48、51)触点以及平面HBT发射极(34)和JHEMT源极(36)和漏极(38)触点。 <图像>

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