首页> 外国专利> polierkissen konturenanzeiger for mechanical or chemical mechanical polishing.

polierkissen konturenanzeiger for mechanical or chemical mechanical polishing.

机译:polierkissen konturenanzeiger用于机械或化学机械抛光。

摘要

A contour indicator that visually indicates non-uniformities in the planarity of the planarizing surface of a polishing pad. In one embodiment of the invention, a polishing pad has a polishing body with a planarizing surface facing the wafer and a contour indicator embedded in the polishing body. The contour indicator is preferably the material of the polishing body dyed to a color or shade that is visually distinguishable from the polishing body. The contour indicator preferably has first and second sidewalls spaced apart from one another at the planarizing surface of the polishing body, and the contour indicator also has a cross-sectional shape so that the distance between the first and second sidewalls changes with increasing the depth within the pad. In operation, the distance between the first and second sidewalls of the contour indicator changes as material is removed from the planarizing surface, and the distance between the first and second sidewalls at the planarizing surface indicates the contour of the planarizing surface.
机译:轮廓指示器,从视觉上指示抛光垫的平坦化表面的平坦度中的不均匀性。在本发明的一个实施例中,抛光垫具有抛光体,该抛光体具有面向晶片的平坦化表面以及嵌入在抛光体中的轮廓指示器。轮廓指示器优选是抛光体的材料,其被染成在视觉上可区别于抛光体的颜色或阴影。轮廓指示器优选地具有在抛光体的平坦化表面处彼此间隔开的第一侧壁和第二侧壁,并且轮廓指示器还具有横截面形状,使得第一侧壁和第二侧壁之间的距离随着内部深度的增加而变化。垫。在操作中,轮廓指示器的第一和第二侧壁之间的距离随着从平坦化表面去除材料而改变,并且在平坦化表面处的第一和第二侧壁之间的距离指示平坦化表面的轮廓。

著录项

  • 公开/公告号DE69712213D1

    专利类型

  • 公开/公告日2002-05-29

    原文格式PDF

  • 申请/专利权人 MICRON TECHNOLOGY INC.;

    申请/专利号DE19976012213T

  • 发明设计人 HENDERSON O.;

    申请日1997-10-03

  • 分类号B24B37/04;B24D13/14;

  • 国家 DE

  • 入库时间 2022-08-22 00:24:55

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