Device for automatic testing of high-speed integrated circuits has a locking circuit and a sampling circuit that allows output data to be sampled at very high frequencies

摘要

Device comprises a high speed data source supplying a test signal to an integrated circuit device under test (11), relays selectively connecting the DUT, output elements (15) coupled to receive input data pulses from the relays and to deliver data impulses to a number of locking circuits (17a-17d) and a sampling element associated with each locking circuit. The sampling element permits each locking element to transfer data pulses from its input to its output. An Independent claim is made for a method for high speed testing of integrated circuits.