首页> 外国专利> ELECTRON ENERGY LOSS SPECTROSCOPE, ELECTRON MICROSCOPE EQUIPPED THEREWITH, AND ELECTRON ENERGY LOSS SPECTRUM MEASURING METHOD

ELECTRON ENERGY LOSS SPECTROSCOPE, ELECTRON MICROSCOPE EQUIPPED THEREWITH, AND ELECTRON ENERGY LOSS SPECTRUM MEASURING METHOD

机译:电子能量损失光谱,装备有电子显微镜的电子能量损失光谱的测定方法

摘要

PROBLEM TO BE SOLVED: To provide accurate and reliable electron energy loss spectrum measuring device capable of measuring electron energy loss spectrum and THEM or STEM provided with the same. SOLUTION: A peak of spectrum is detected by an electron beam detector, a gap amount of the peak position from a reference position on the electron beam detector is detected, and the gap amount is corrected by using a control device controlling an electron beam position on the electron beam detector. Electron energy loss spectrum is measured while controlling the correction of a gap amount between an electron beam position on a sample and a peak position of a spectrum and spectrum measurement by the electron beam detector. An accurate electron energy loss spectrum is acquired with an electron microscope provided with the electron energy loss spectroscope.
机译:解决的问题:提供能够测量电子能量损失谱的准确而可靠的电子能量损失谱测量装置及其所具有的THEM或STEM。解决方案:用电子束检测器检测光谱的峰,检测峰位置与电子束检测器上参考位置的间隙量,并使用控制电子束位置的控制装置校正间隙量。电子束探测器。在控制样品上的电子束位置与光谱的峰值位置之间的间隙量的校正以及由电子束检测器进行的光谱测量的同时,测量电子能量损失谱。用配备有电子能量损失谱仪的电子显微镜获得准确的电子能量损失谱。

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