首页> 外国专利> PHOTO-OXIDATION METHOD, METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE USING THE SAME, PHOTO-OXIDATION APPARATUS AND APPARATUS FOR MANUFACTURING SEMICONDUCTOR DEVICE

PHOTO-OXIDATION METHOD, METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE USING THE SAME, PHOTO-OXIDATION APPARATUS AND APPARATUS FOR MANUFACTURING SEMICONDUCTOR DEVICE

机译:光氧化方法,使用该光氧化方法制造半导体装置的方法,光氧化装置以及制造半导体装置的装置

摘要

PROBLEM TO BE SOLVED: To provide a photo-oxidation method for effectively forming an insulation film by suppressing generation of interface level and fixed charges or the like under lower temperatures, and also provide a method of manufacturing a semiconductor device using the same and a photo-oxidation apparatus.;SOLUTION: A substrate 6, on which the Si film is formed, is set into a vacuum chamber 2, it is then heated with a lamp heater 7 under evacuation conditions. Moreover, the substrate 6 is then exposed to a gas, having the oxidation property containing oxygen and rare gas and is irradiated with ultraviolet radiation 5 emitted by a lamp 1.;COPYRIGHT: (C)2003,JPO
机译:解决的问题:提供一种通过在较低温度下抑制界面能和固定电荷等的产生来有效地形成绝缘膜的光氧化方法,并且还提供了使用该氧化方法制造半导体器件的方法。 -氧化装置。解决方案:将其上形成有Si膜的衬底6放入真空室2中,然后在抽真空条件下用灯加热器7对其进行加热。此外,然后将基板6暴露于具有包含氧气和稀有气体的氧化特性的气体中,并用灯1发出的紫外线5照射。COPYRIGHT:(C)2003,JPO

著录项

  • 公开/公告号JP2003151974A

    专利类型

  • 公开/公告日2003-05-23

    原文格式PDF

  • 申请/专利权人 SHARP CORP;

    申请/专利号JP20010343718

  • 申请日2001-11-08

  • 分类号H01L21/316;H01L21/336;H01L27/08;H01L29/786;

  • 国家 JP

  • 入库时间 2022-08-22 00:15:41

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