首页> 外国专利> INSTRUMENT FOR MEASURING WAVELENGTH, INSTRUMENT FOR MEASURING OPTICAL CHARACTERISTIC, METHOD OF MEASURING THE WAVELENGTH, AND SOFTWARE ARTICLE

INSTRUMENT FOR MEASURING WAVELENGTH, INSTRUMENT FOR MEASURING OPTICAL CHARACTERISTIC, METHOD OF MEASURING THE WAVELENGTH, AND SOFTWARE ARTICLE

机译:测量波长的仪器,测量光学特性的仪器,测量波长的方法以及软件文章

摘要

PROBLEM TO BE SOLVED: To enhance accuracy of wavelength measurement. ;SOLUTION: This wavelength measuring instrument 20 for measuring wavelengths of plural successive optical signals (t) is provided with a wavemeter unit 30 for measuring the first wavelength value 1(t) about the optical signals (t), an absolute measurement unit 40 for measuring an absolute value having a wavelength characteristic determined in known absolute wavelength values and covered with the optical signals (t) out of the known absolute values, as the second wavelength value 2(t), and an evaluation unit 50 for receiving the first and second wavelength values 1(t), 2(t) measured hereinbefore, and for providing a wavelength values 1'(t) corrected based on a mutual comparison result between the measured first and second wavelength values 1(t), 2(t).;COPYRIGHT: (C)2003,JPO
机译:要解决的问题:提高波长测量的准确性。 ;解决方案:该用于测量多个连续光信号(t)的波长的波长测量仪器20设有用于测量关于光信号(t)的第一波长值1(t)的波长表单元30,以及用于测量光信号(t)的绝对值测量单元40。测量具有在已知的绝对波长值中确定的并且被该已知的绝对值中的光信号(t)覆盖的波长特性的绝对值,作为第二波长值2(t),以及评估单元50,用于接收第一和第二波长值。之前测量的第二波长值1(t),2(t),用于提供基于测量的第一和第二波长值1(t),2(t)之间的相互比较结果校正的波长值1'(t) 。;版权:(C)2003,日本特许厅

著录项

  • 公开/公告号JP2002365142A

    专利类型

  • 公开/公告日2002-12-18

    原文格式PDF

  • 申请/专利权人 AGILENT TECHNOL INC;

    申请/专利号JP20020090565

  • 发明设计人 STOLTE RALF;THOMA PETER;MUELLER EMMERICH;

    申请日2002-03-28

  • 分类号G01J9/02;G01J3/02;

  • 国家 JP

  • 入库时间 2022-08-22 00:14:41

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号