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OPTICAL MEASURING INSTRUMENT, AND WAVELENGTH CALIBRATION METHOD OF OPTICAL DETECTOR AND OPTICAL MEASURING METHOD

机译:光学检测仪器,光学检测器的波长校准方法及光学检测方法

摘要

PROBLEM TO BE SOLVED: To provide a compact instrument used for an optical system measuring method using a flow path, and a novel technology for easily calibrating a wavelength of a used optical detector.;SOLUTION: The optical measuring instrument 1 used for the method for optically measuring a sample S flowing through the channel 11 includes the channel 11 for flowing the sample S, a first light source 12, having a light emitting diode (LED: Light Emitting Diode) for implementing an optical adjustment and/or an image confirmation within the channel, a second light source 13 for irradiating the sample flowing through the channel with a light, and the optical detector 14 for detecting spectrums emitted from the first and second light sources.;COPYRIGHT: (C)2010,JPO&INPIT
机译:要解决的问题:提供一种紧凑的仪器,该仪器用于使用流路的光学系统测量方法,以及一种新颖的技术,可以轻松地校准所用光学检测器的波长。解决方案:用于该方法的光学测量仪器1光学测量流经通道11的样品S包括用于使样品S流动的通道11,第一光源12,该第一光源12具有用于在其中进行光学调整和/或图像确认的发光二极管(LED:Light Emitting Diode)。通道;第二光源13,用于向流过通道的样品照射光;光学检测器14,用于检测从第一和第二光源发出的光谱。版权所有:(C)2010,JPO&INPIT

著录项

  • 公开/公告号JP2010008397A

    专利类型

  • 公开/公告日2010-01-14

    原文格式PDF

  • 申请/专利权人 SONY CORP;

    申请/专利号JP20090001233

  • 发明设计人 FURUKI MOTOHIRO;IMANISHI SHINGO;

    申请日2009-01-07

  • 分类号G01N21/27;G01N21/64;

  • 国家 JP

  • 入库时间 2022-08-21 19:04:44

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