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METHOD AND APPARATUS FOR ANALYZING IMPURITY IN TANTALUM-BASED MATERIAL, AND TANTALUM OXIDE POWDER

机译:钽基材料和氧化钽粉中杂质的分析方法和装置

摘要

PPROBLEM TO BE SOLVED: To provide an analysis method and an analysis apparatus of impurities in a tantalum-based material for continuously and accurately analyzing all of an extremely small amount of impurities and simply automating the analysis, and to provide tantalum oxide powder. PSOLUTION: In the analysis method of impurities in a tantalum-based material for determining the quantity of impurities in the tantalum-based material by a flow injection analysis method, a process is provided where a channel 10 for continuously feeding eluent to columns 32 and 33 where an anion ion exchange resin is filled is formed, a tantalum-based material solution sample is injected into the upstream side of the columns 32 and 33, impurities in the impurities other than tantalum in the tantalum-based material solution sample are eluated by the anion ion exchange resin, and the quantity of impurities contained in eluate that is continuously eluted from the column concerned is determined by an induction coupling plasma mass spectroscope 40. The quantity- determining process is repeated at least for two times by changing the conditions of the induction coupling plasma mass spectroscope. PCOPYRIGHT: (C)2003,JPO
机译:

要解决的问题:提供一种钽基材料中杂质的分析方法和分析装置,用于连续且准确地分析所有极少量杂质并简单地使分析自动化,并提供氧化钽粉末。

解决方案:在用于通过流动注射分析方法确定钽基材料中杂质含量的钽基材料中杂质的分析方法中,提供了一种方法,其中将通道10连续注入色谱柱形成填充有阴离子交换树脂的32、33,在塔32、33的上游侧注入钽系材料溶液试样,钽系材料溶液试样中的钽以外的杂质为杂质。通过阴离子交换树脂洗脱,并通过感应耦合等离子体质谱仪40确定从有关色谱柱中连续洗脱出的洗脱液中所含杂质的数量。耦合等离子体质谱仪的条件

版权:(C)2003,日本特许厅

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