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HIGH ACCURACY MEASURING METHOD USING STRAIGHTNESS MEASURING DEVICE

机译:利用直线度测量装置的高精度测量方法

摘要

PROBLEM TO BE SOLVED: To provide a method and a device enabling highly-accurate straightness measurement by inhibiting any effect from a motional error caused in association with movement of a sensor or from a zero point error caused when using multiple sensors.;SOLUTION: The method accurately measures the straightness of a specific line S on a testing subject for calibration 10 in advance, and then uses sensors 40A, 40B, 42 to move and measure the specific line S to calculate a systematic error caused by either the motional error associated with the movement of the displacement sensor 42 or the zero point error between the sensor 40A and the sensor 40B. For an actual straightness measuring of an optional testing surface 14, the systematic error should be subtracted from the measurement obtained by the sensor at each measuring point.;COPYRIGHT: (C)2003,JPO
机译:解决的问题:提供一种方法和设备,通过抑制与传感器的移动相关的运动误差或使用多个传感器时的零位误差引起的任何影响,从而实现高精度的直线度测量。该方法预先准确地测量了要校准的测试对象10上的特定线S的直线度,然后使用传感器40A,40B,42移动并测量该特定线S以计算由与运动相关的运动误差引起的系统误差位移传感器42的运动或传感器40A与传感器40B之间的零点误差。对于可选测试表面14的实际直线度测量,应从传感器在每个测量点获得的测量值中减去系统误差。;版权:(C)2003,JPO

著录项

  • 公开/公告号JP2003130640A

    专利类型

  • 公开/公告日2003-05-08

    原文格式PDF

  • 申请/专利权人 MITSUTOYO CORP;

    申请/专利号JP20010329828

  • 申请日2001-10-26

  • 分类号G01B21/30;G01B11/24;G01B11/30;G01D18/00;

  • 国家 JP

  • 入库时间 2022-08-22 00:13:12

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