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Specimen observation method in atomic force microscopy and atomic force microscope
Specimen observation method in atomic force microscopy and atomic force microscope
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机译:原子力显微镜和原子力显微镜的试样观察方法
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摘要
A method and apparatus for observing a specimen in atomic force microscopy with a vibrating cantilever maintained in resonance while a probe attached to the cantilever is maintained in contact with the specimen. The Q factor of the cantilever is determined based upon the detected amplitude.
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