Semiconductor memory device capable of concurrently diagnosing a plurality of memory banks and method thereof

摘要

A memory diagnostic circuit includes: a diagnostic circuit which sets a plurality of memory banks to an access/enable state at one time, writes predetermined common data into the memory banks, and parallelly reads out storage data of the plurality of memory banks; a comparison circuit which compares the data read out from the plurality of memory banks with the data written into the memory banks; and a discrimination circuit which discriminates whether or not there is any defect in the plurality of memory banks based on a comparison result.