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Method of extracting timing characteristics of transistor circuits, storage medium storing timing characteristic library, LSI designing method, and gate extraction method

机译:提取晶体管电路的时序特性的方法,存储时序特性库的存储介质,LSI设计方法和栅极提取方法

摘要

A method of extracting timing characteristics from transistor circuit data of modularity design products (a module) such as a CPU core in which the extracted timing characteristics are used for the timing verification of a circuit including a module to be extracted and timing constraints when logical synthesis or timing-driven layout is made. Particularly, since conditions fit for a timing rule of the module are included in timing characteristics when timing verification is executed by simulation, verification free of pseudo error is enabled. Also, the configuration of a timing characteristic library, a storage medium storing it and an LSI designing method using the storage medium are provided.
机译:一种从诸如CPU核的模块化设计产品(模块)的晶体管电路数据中提取时序特性的方法,其中,所提取的时序特性用于对包括要提取的模块和逻辑合成时的时序约束的电路进行时序验证。或按时间安排布局。特别地,当通过仿真执行时序验证时,由于适合模块的时序规则的条件被包括在时序特性中,所以能够进行没有伪错误的验证。另外,提供了定时特性库的配置,存储该定时特性库的存储介质以及使用该存储介质的LSI设计方法。

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