Method for implementing dynamic burn-in testing using static test signals

摘要

A method for dynamically burn-in testing a PLD by either configuring or fabricating the PLD to implement a self-executing logic operation that automatically and repeatedly turns on and off selected transistors of the PLD using only static test signals. The self-executing logic operation implemented by the PLD includes a driving logic function (e.g., an oscillator) and a driven logic function (e.g., a counter). The PLD is placed on a conventional load board and heated in a conventional oven while static test signals are applied to selected terminals of the PLD through the load board, thereby causing the PLD to implement the self-executing logic operation.