首页> 外国专利> Focused ion beam apparatus having a gas injector in which one of a plurality of nozzles can be selectively driven for elevation

Focused ion beam apparatus having a gas injector in which one of a plurality of nozzles can be selectively driven for elevation

机译:具有气体喷射器的聚焦离子束设备,其中可以选择性地驱动多个喷嘴之一以进行提升

摘要

A focused ion beam apparatus has a gas injector provided with a plurality of gas supply pipes each having a nozzle at one end for ejecting a gas and a housing in which the plurality of gas supply pipes are slidably accommodated. The housing has a tip portion with a hole provided at a terminal end thereof and the hole has a size set so that only one of the nozzles can extend therefrom. In addition, the housing has a tapered nozzle guide portion for guiding a selected nozzle from a retracted position at which the selected nozzle does not extend from the hole to an extended position at which the selected nozzle extends from the hole.
机译:聚焦离子束设备具有:气体喷射器,其具有多个气体供应管,每个气体供应管的一端具有用于喷射气体的喷嘴;以及壳体,多个气体供应管可滑动地容纳在该壳体中。壳体具有在其末端处设有孔的尖端部分,并且该孔的尺寸设定为使得仅一个喷嘴可以从其延伸。另外,壳体具有锥形喷嘴引导部分,该锥形喷嘴引导部分用于将所选喷嘴从缩回位置引导到选定位置,该缩回位置处所选喷嘴不从孔延伸,而缩回位置处所选喷嘴从孔延伸。

著录项

  • 公开/公告号US6576913B2

    专利类型

  • 公开/公告日2003-06-10

    原文格式PDF

  • 申请/专利权人 SEIKO INSTRUMENTS INC.;

    申请/专利号US20020140710

  • 发明设计人 YOSHIHIRO KOYAMA;

    申请日2002-05-08

  • 分类号H01J370/80;

  • 国家 US

  • 入库时间 2022-08-22 00:04:26

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