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X-RAY FLUORESCENCE MEASURING SYSTEM AND METHODS FOR TRACE ELEMENTS

机译:微量元素的X射线荧光测量系统和方法

摘要

An X-ray fluorescence measuring system and related measuring methods are disclosed. the system using X-ray energy at a level of less than 80 KeV may be directed toward a material, such as coal. The energy fluoresced may be detected (10) and used to measure the elemental composition of the material, including trace elements. The material may be moving or stationary.
机译:公开了一种X射线荧光测量系统和相关的测量方法。使用低于80 KeV的X射线能量的系统可能会指向诸如煤的材料。发出荧光的能量可以被检测(10),并被用来测量材料的元素组成,包括痕量元素。材料可以是移动的或固定的。

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