首页> 外国专利> Confirmed apparatus of wafer's edge in Chemical-mechanical polishing

Confirmed apparatus of wafer's edge in Chemical-mechanical polishing

机译:在化学机械抛光中确认晶片边缘的装置

摘要

PURPOSE: An apparatus for confirming wafer's edge in chemical mechanical polishing is provided to be capable of easily detecting wafer state including the wafer damage according to the result of the CMP process by using a rotating part. CONSTITUTION: An apparatus for confirming wafer's edge(10) is provided with a cassette(20) having a plurality of slot(S) for storing wafers(W), a lever(32) capable of moving up and down the wafer(W) by the pressure of a worker, a rotating part(34) attached to the lever(32) for rotating the wafer(W), and a housing(30) connected through the inner portion of the cassette(20) for being capable of moving up and down and rotating the wafer(W). The rotating part(34) further includes a driving shaft, a rotating shaft geared to the driving shaft, a belt for rotating the wafer(W), and a plurality of rollers for moving the belt and preventing the sag of the belt.
机译:目的:提供一种用于在化学机械抛光中确认晶片边缘的设备,该设备能够通过利用旋转部件根据CMP工艺的结果来容易地检测包括晶片损坏在内的晶片状态。构成:一种用于确认晶片边缘的装置(10),具有一个盒(20),该盒具有多个用于存储晶片(W)的插槽(S),以及一个能够上下移动晶片(W)的杠杆(32)。在作业人员的压力下,安装在使晶片W旋转的控制杆32上的旋转部34和通过盒20的内部连接而能够移动的壳体30。上下旋转晶圆(W)。旋转部分(34)还包括驱动轴,与该驱动轴齿轮连接的旋转轴,用于旋转晶片(W)的皮带以及用于移动皮带并防止皮带下垂的多个辊。

著录项

  • 公开/公告号KR20030045381A

    专利类型

  • 公开/公告日2003-06-11

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号KR20010076075

  • 发明设计人 LEE JAE IL;

    申请日2001-12-04

  • 分类号H01L21/306;

  • 国家 KR

  • 入库时间 2022-08-21 23:46:56

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