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Etching Solutions for Cu Monolayer or Cu Molybdenum Multilayers and Method of Preparing the Same

机译:铜单层或铜钼多层的蚀刻溶液及其制备方法

摘要

PURPOSE: Etching solutions for Cu monolayer or Cu-molybdenum multilayers comprising deionized water and two types of additives comprising hydrogen peroxide water, organic acid, phosphate and nitrogen, and an etching method are provided. CONSTITUTION: The etching solutions comprises first additive comprising 8 to 20 wt.% of hydrogen peroxide water for the total weight of composition, 1 to 5 wt.% of organic acid for the total weight of composition, 0.2 to 5 wt.% of phosphate for the total weight of composition and 0.2 to 5 wt.% of nitrogen for the total weight of composition; second additive comprising 0.2 to 5 wt.% of nitrogen for the total weight of composition; and a balance of deionized water for the total weight of composition. The etching method comprises first step of depositing copper/molybdenum layer on a substrate; second step of selectively leaving photoresist on the copper/molybdenum layer; and third step of etching the copper/molybdenum layer using the etching solution, wherein the copper/molybdenum layer is a double film in which copper film(14) is formed on molybdenum layer(12), wherein thickness of the copper layer is thicker than that of the molybdenum layer, wherein the substrate is a glass substrate(10) for TFT LCD (thin film transistor liquid crystal display), and wherein the copper layer is a source/drain wiring.
机译:目的:提供用于铜单层或铜钼多层的蚀刻溶液,该溶液包括去离子水和两种类型的添加剂,包括过氧化氢水,有机酸,磷酸盐和氮气,以及蚀刻方法。组成:蚀刻溶液包含第一添加剂,该添加剂包含占组合物总重量的8至20重量%的过氧化氢水,占组合物总重量的1至5重量%的有机酸,0.2至5重量%的磷酸盐对于组合物的总重量,和占组合物总重量的0.2-5重量%的氮;第二添加剂,其占组合物总重量的0.2至5重量%的氮;剩余的去离子水占组合物总重量。蚀刻方法包括在基板上沉积铜/钼层的第一步;第二步,在铜/钼层上选择性地留下光刻胶。第三步骤,其特征在于,所述铜钼层为在钼层(12)上形成有铜膜(14)的双层膜,所述铜膜的厚度比所述铜层的厚度大。衬底层是钼层的衬底,其中衬底是用于TFT LCD(薄膜晶体管液晶显示器)的玻璃衬底(10),并且其中铜层是源/漏布线。

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