首页> 外国专利> Αl ALLOY THIN FILM FOR SEMICONDUCTOR DEVICE ELECTRODE AND SPUTTERING TARGET FOR FORMING Αl ALLOY THIN FILM FOR SEMICONDUCTOR DEVICE ELECTRODE

Αl ALLOY THIN FILM FOR SEMICONDUCTOR DEVICE ELECTRODE AND SPUTTERING TARGET FOR FORMING Αl ALLOY THIN FILM FOR SEMICONDUCTOR DEVICE ELECTRODE

机译:用于半导体器件电极的铝合金薄膜和用于形成半导体器件电极的铝合金薄膜的溅射靶

摘要

The present invention provides an Al alloy thin film for a semiconductor device electrode having an electrical resistivity of as low as 6 muOMEGAcm or less, high hillock resistance, high void resistance, and high corrosion resistance against an alkaline solution, which are required for an electrode thin film of large-screen liquid crystal display (LCD) or high-resolution LCD. The present invention also provides a sputtering target to deposit the Al alloy film by sputtering process for a semiconductor device electrode. The Al alloy thin film for a semiconductor device electrode satisfies the conditions of Y=0.3 at %, IVa group metal element=0.2 at %, and 0.3Cy+3CIVa=2 (wherein Cy: Y content (at %), CIVa: content of IVa group metal element (at %)), and the sputtering target is made of an Al alloy satisfying the above conditions.
机译:本发明提供了一种用于半导体器件电极的铝合金薄膜,其具有电极所需的电阻率低至6μOMEGAcm以下,高的耐小丘性,高的耐空洞性和对碱性溶液的高耐腐蚀性。大屏幕液晶显示器(LCD)或高分辨率LCD的薄膜。本发明还提供了一种溅射靶,用于通过溅射工艺沉积用于半导体器件电极的铝合金膜。用于半导体器件电极的铝合金薄膜满足以下条件:Y> = 0.3at%,IVa族金属元素> = 0.2at%,并且0.3Cy + 3CIVa <= 2(其中Cy:Y含量(at%), CIVa:IVa族金属元素的含量(at%),溅射靶由满足上述条件的Al合金制成。

著录项

  • 公开/公告号KR100366674B1

    专利类型

  • 公开/公告日2003-01-09

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20000040486

  • 发明设计人 다카기가츠토시;오니시다카시;

    申请日2000-07-14

  • 分类号C23C14/34;

  • 国家 KR

  • 入库时间 2022-08-21 23:45:52

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