Continuity tester for semiconductor devices, has light emitting diode to signal when substrate contacts probe and current flows between pogo pin and pad

摘要

The tester has a substrate (21) with a pad (23) and a power supply (13) to provide a voltage difference between the pad and the pogo pins (11,12). A light emitting diode (LED) (22), signals when the substrate contacts the probe and a current is generated by connection of the pogo pin and the pad. The supply, LED, pad and the pogo pins form a closed loop to provide the current flow path. An Independent claim is also included for the method to test the continuity of a pogo pin in a probe.