首页> 外国专利> Process for etching and drying substrates comprises contacting the substrates with an aqueous etching solution, lifting the substrates from the solution, and completely drying the substrates directly after etching

Process for etching and drying substrates comprises contacting the substrates with an aqueous etching solution, lifting the substrates from the solution, and completely drying the substrates directly after etching

机译:蚀刻和干燥基板的方法包括使基板与蚀刻水溶液接触,从溶液中提起基板,以及在蚀刻之后直接完全干燥基板

摘要

Process for etching and drying substrates comprises contacting the substrates with an aqueous etching solution having an HF concentration of 0.5-50.0 wt.% and heated to 20-70degrees C, relatively moving the substrates and a surface of the etching solution so that the substrates can be partially lifted from the etching solution, further moving the substrates and the surface of the etching solution with a first lifting device at a speed high enough to completely remove the etching solution from the substrates, and completely drying the substrates directly after etching.
机译:蚀刻和干燥基板的方法包括使基板与HF浓度为0.5-50.0wt。%的水性蚀刻溶液接触并加热至20-70℃,使基板和蚀刻溶液的表面相对移动,使得基板可以从蚀刻溶液中将其部分地提起,然后用第一提升装置以足够高的速度进一步移动基板和蚀刻溶液的表面,该速度足以从基板上完全去除蚀刻溶液,并在蚀刻后直接完全干燥基板。

著录项

  • 公开/公告号DE10215044A1

    专利类型

  • 公开/公告日2003-10-23

    原文格式PDF

  • 申请/专利权人 ASTEC HALBLEITERTECHNOLOGIE GMBH;

    申请/专利号DE2002115044

  • 发明设计人

    申请日2002-04-05

  • 分类号C23F1/00;C03C15/00;

  • 国家 DE

  • 入库时间 2022-08-21 23:42:02

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