METHOD AND SYSTEM FOR MEASURING A SHORT TEMPORAL RESPONSE USING A SHORT PULSE

摘要

P The invention relates to the measurement of a short time response using a short pulse. It relates to a measurement system which projects a pulse of pumping light onto a sample, the projecting a sample light pulse, and observing a change in the reflected sample light pulse. The system comprises a source (1) of an excitation pulse, and another source (2) of a sampling pulse, an electric adjustment member (3) of the difference between the moments at which the pulse of pumping light irradiates the sample and the pulse of sampling light irradiates the sample, and a detector (21) of the time difference between the pulses. Application to the measurement of properties of thin films. / P