首页> 外国专利> METHOD FOR REPAIRING DEFECT OF OPTOELECTRONIC DEVICE, OPTOELECTRONIC DEVICE, ELECTRONIC DEVICE PROVIDED WITH THE SAME, AND METHOD AND DEVICE FOR MANUFACTURING OPTOELECTRONIC DEVICE

METHOD FOR REPAIRING DEFECT OF OPTOELECTRONIC DEVICE, OPTOELECTRONIC DEVICE, ELECTRONIC DEVICE PROVIDED WITH THE SAME, AND METHOD AND DEVICE FOR MANUFACTURING OPTOELECTRONIC DEVICE

机译:修复光电子装置的缺陷的方法,光电子装置,具有该光电子装置的电子装置以及制造光电子装置的方法和装置

摘要

PROBLEM TO BE SOLVED: To repair a defective dot of an optoelectronic device by a highly practical technique without necessitating a large-scale device and technology of a high level.;SOLUTION: In a method for repairing the defective dot 4b which does not operate normally in the optoelectronic device which is provided with a display panel 1 wherein a plurality of dots are arranged and performs display by controlling the light quantity emitted from each dot, a reflection member 11 is provided on the visual confirmation side of the display panel 1 so as to cover the whole defective dot 4b and a light transmissive optical member 12 refracting light emitted from adjacent dots 4g and 4r adjacent to the defective dot 4b is provided so as to collectively cover the reflection member 11 and a part of the adjacent dots 4g and 4r.;COPYRIGHT: (C)2004,JPO
机译:解决的问题:通过高度实用的技术来修复光电子器件的缺陷点,而无需大规模的设备和高水平的技术。解决方案:一种用于修复不能正常工作的缺陷点4b的方法在具有布置有多个点的显示面板1的光电装置中,并且通过控制从每个点发射的光量来执行显示,在显示面板1的视觉确认侧上设置有反射构件11,从而以覆盖整个缺陷点4b和透光光学部件12的方式,使从与缺陷点4b相邻的相邻点4g和4r发射的光折射,以共同覆盖反射部件11和相邻点4g和4r的一部分。 。;版权:(C)2004,日本特许厅

著录项

  • 公开/公告号JP2004070073A

    专利类型

  • 公开/公告日2004-03-04

    原文格式PDF

  • 申请/专利权人 SEIKO EPSON CORP;

    申请/专利号JP20020230290

  • 发明设计人 IWATA YUJI;

    申请日2002-08-07

  • 分类号G02F1/13;B05D1/26;G02F1/1335;G09F9/00;

  • 国家 JP

  • 入库时间 2022-08-21 23:26:22

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