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Method and apparatus for determining analytical data regarding the interior of a scattering matrix

机译:用于确定关于散射矩阵内部的分析数据的方法和设备

摘要

The method involves first performing detection measurements with which light is beamed as primary light through the boundary surface (5) of the matrix at an irradiation point (12). The light then emerging from the scattering matrix through the surface is detected at a detection point (13) located at a predetermined measurement distance from the irradiation point as secondary light. The measurable physical properties of the secondary light is determined as a measurement parameter, as a measure of the analytical data to be measured, from the interaction of the light with the scattering matrix. In the detection procedure at least two measurements are taken for different reflection conditions at the boundary surface between the irradiation point and the detection point from which a value is obtained for the measurement parameter.
机译:该方法包括首先执行检测测量,利用该检测测量将光作为一次光在照射点(12)处穿过基质的边界表面(5)。然后从散射矩阵穿过表面出射的光在位于与照射点相距预定测量距离的检测点(13)处被检测为二次光。从光与散射矩阵的相互作用将二次光的可测量物理性质确定为测量参数,作为待测分析数据的度量。在检测过程中,在照射点和检测点之间的边界表面上针对不同的反射条件进行至少两次测量,从中获得测量参数的值。

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