MULTIPLE SCAN CHAIN CIRCUIT WITH PIN SHARING, ITS TEST METHOD, AND SCAN VECTOR LOADING METHOD

摘要

PROBLEM TO BE SOLVED: To provide a multiple scan chain circuit which prevents increase in the number of pins, and shortens test execution time.;SOLUTION: The scan vectors of a multiple scan chain are continuously applied to a single scan input terminal 30. Each scan vector of the multiple scan chain is inputted to a corresponding scan chain being related by a corresponding scan clock signal out of multiple scan clock signals SCK1-SCKN. The outputs of the multiple scan chain is successively selected by a multiplexer 32 and is outputted to one scan output terminal 34.;COPYRIGHT: (C)2004,JPO