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Timing requirement and containment of output state is eased the dynamic logic gate

机译:时序要求和对输出状态的约束减轻了动态逻辑门

摘要

A dynamic logic gate having a short precharge period during an evaluation phase of a clock and a tri-state hold period during a precharge phase of the clock. The evaluation time is extended into the precharge phase. As a result of extended evaluation time and no latching set-up time, evaluation timing for upstream logic is relaxed since upstream logic is not required to evaluate before the worst case time for the clock to enter the precharge phase. The gate provides the function of latching without the delay of latching. As a result of holding during the precharge phase of the clock, one latch is eliminated for testing. As a result of tri-stating during the precharge phase of the clock, control during testing is simplified. In a single-rail embodiment (figure 4), the short precharge period is open loop. In a dual-rail implementation (figure 6), the precharge period ends when both evaluation nodes (606, 608) are charged. In the dual-rail implementation, both evaluate nodes are tri-stated as soon as one node discharges, thereby providing first incidence latching. IMAGE
机译:一种动态逻辑门,其在时钟的评估阶段具有较短的预充电周期,在时钟的预充电阶段具有三态保持周期。评估时间延长到预充电阶段。由于延长了评估时间,并且没有锁存建立时间,因此可以放宽上游逻辑的评估时序,因为不需要在最坏情况下才可以使时钟进入预充电阶段进行评估。门具有锁存功能,没有锁存延迟。在时钟的预充电阶段保持的结果是,消除了一个用于测试的锁存器。由于在时钟的预充电阶段处于三态,因此简化了测试过程中的控制。在单轨实施例中(图4),较短的预充电周期为开环。在双轨实施中(图6),当两个评估节点(606、608)都充电时,预充电时间段结束。在双轨实施中,一个节点放电后,两个评估节点均处于三态,从而提供了第一入射锁存。 <图像>

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