Grain survey instrument

摘要

PROBLEM TO BE SOLVED: To provide a grain inspection apparatus by which the constitution of a facility can be simplified by adotping a rational constitution, which shortens the processing time of an inspection and which can enhance the efficiency of an operation. ;SOLUTION: A grain inspection apparatus is constituted in such a way that a sample grain collected from grains received by a grain treatment facility used to dry and treat grains is bran-removed and treated so as to be inspected. In this case, an imaging means 61 which images the sample grain is provided, and a control device HF by which the outward appearance grade of the grains and the yield of the grains are judged on the basis of imaged information by the imaging means 61 after the bran removal treatment is provided.;COPYRIGHT: (C)1999,JPO