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Methods of forming semiconductor devices having field oxides in trenches and devices formed thereby

机译:形成在沟槽中具有场氧化物的半导体器件的方法以及由此形成的器件

摘要

Semiconductor devices and methods of forming devices that have field oxides in trenches are disclosed. According to the methods, a semiconductor substrate is prepared. An upper trench is formed at a predetermined region of the semiconductor substrate and a bottom trench is formed at a bottom surface of the upper trench. A field oxide is formed to fill the bottom trench and the upper trench. At this time, the upper trench has a wider width than the bottom trench.
机译:公开了半导体器件和形成在沟槽中具有场氧化物的器件的方法。根据该方法,制备半导体衬底。上沟槽形成在半导体衬底的预定区域处,而下沟槽形成在上沟槽的底表面处。形成场氧化物以填充底部沟槽和上部沟槽。此时,上沟槽的宽度比下沟槽的宽度大。

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