首页> 外国专利> Probe testing method and apparatus for determining acceptable/defective end shape of contact probe through image analysis

Probe testing method and apparatus for determining acceptable/defective end shape of contact probe through image analysis

机译:通过图像分析确定接触式探针合格/不良末端形状的探针测试方法和装置

摘要

A probe testing apparatus reads the surface shape of a contact pad in pressure contact with a contact probe, and differentiates the read surface shape to extract a multiplicity of flat parts. Next, the probe testing apparatus complements the multiplicity of flat parts to generate a reference shape, and subtracts the reference shape from an averaged surface shape to detect a plurality of recesses having a predetermined depth or more. Next, the probe testing apparatus selects one from the plurality of recesses corresponding to reference information, enlarges the selected recess outward by predetermined dimensions, and subtracts the reference shape from the initial surface shape at the position of the enlarged recess to detect an impression of the contact probe. Finally, the probe testing apparatus determines from the position and depth of the detected impression whether the contact probe is acceptable or defective. In this manner, even if the compact pad is formed with miniature irregularities on the surface thereof, the probe testing apparatus can precisely detect the impression of the contact probe from the surface shape to determine whether the contact probe is acceptable or defective.
机译:探针测试装置读取与接触探针压力接触的接触垫的表面形状,并区分所读取的表面形状以提取多个平坦部分。接下来,探针测试装置对多个平坦部分进行补充以产生参考形状,并且从平均表面形状中减去参考形状以检测具有预定深度或更大深度的多个凹部。接下来,探针测试装置从与基准信息相对应的多个凹部中选择一个,将所选择的凹部向外扩大预定尺寸,并在扩大的凹部的位置从初始表面形状减去基准形状,以检测该凹部的压痕。接触探针。最后,探针测试设备根据检测到的压痕的位置和深度来确定接触探针是否合格。以此方式,即使紧凑垫在其表面上形成有微小的凹凸,探针测试设备也可以从表面形状精确地检测接触探针的压痕,从而确定接触探针是合格的还是不良的。

著录项

  • 公开/公告号US2004083073A1

    专利类型

  • 公开/公告日2004-04-29

    原文格式PDF

  • 申请/专利权人 NEC ELECTRONICS CORPORATION;

    申请/专利号US20030644071

  • 发明设计人 TAKASHI NISHIKAWA;YOSHIHIRO SASAKI;

    申请日2003-08-20

  • 分类号G01R31/14;

  • 国家 US

  • 入库时间 2022-08-21 23:16:28

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