PROBE CARD FOR CALIBRATING CONTACT POSITION PROBE TEST APPARATUS METHOD FOR SETTING THE PROBE CARD AND METHOD ALIGNING THE PROBE TEST APPARATUS USING THE PROBE CARD FOR CALIBRATION CONTACT POSITION

摘要

A probe card for calibration according to the present technology includes a probe card PCB and a plurality of probe needles installed on the probe card PCB, wherein the plurality of probe needles include a first needle pin provided to enable position correction, and the first needle pin A second needle pin is spaced apart from each other by a predetermined interval to be a reference point when the position of the first needle pin is corrected, and the first needle pin is spaced apart from the first needle pin by a predetermined interval, and when the position of the first needle pin is corrected, the second needle pin is the reference point. It may include a third needle pin aligned with the position correcting the first needle pin.