首页> 外国专利> Combined transistor-capacitor structure in deep sub-micron CMOS for power amplifiers

Combined transistor-capacitor structure in deep sub-micron CMOS for power amplifiers

机译:深亚微米CMOS中的功率放大器组合晶体管-电容器结构

摘要

A combined transistor and capacitor structure comprising a transistor having alternating source and drain regions formed in a substrate of semiconductor material, and a capacitor formed over the transistor. The capacitor has at least first and second levels of electrically conductive parallel lines arranged in vertical rows, and at least one via connecting the first and second levels of lines in each of the rows, thereby forming a parallel array of vertical capacitor plates. A dielectric material is disposed between the vertical plates of the array. The vertical array of capacitor plates are electrically connected to the alternating source and drain regions of the transistor which form opposing nodes of the capacitor and electrically interdigitate the vertical array of capacitor plates.
机译:晶体管和电容器的组合结构,包括:具有在半导体材料的衬底中形成的交替的源极和漏极区域的晶体管;以及形成在该晶体管上方的电容器。电容器具有布置成垂直行的至少第一和第二水平的导电平行线,以及至少一个通孔,其连接每行中的第一水平和第二水平的线,从而形成垂直电容器板的平行阵列。电介质材料设置在阵列的垂直板之间。电容器板的垂直阵列电连接到晶体管的交替的源极和漏极区域,所述晶体管的交替的源极和漏极区域形成电容器的相对节点并且电交叉电容器板的垂直阵列。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号