Method for detecting faults in electronic devices, based on quiescent current measurements

摘要

The present invention is related to a method for testing a micro-electronic device, by applying a plurality of test vectors to said device, and measuring for each test vector, the quiescent supply current I_DDQ, to said device, wherein each I_DDQ measured value is divided by another I_DDQ value, and wherein the result of said division is compared to a predefined reference, resulting in a pass or fail decision for said device.