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Mirror surface accuracy measuring device and mirror surface control system of reflector antenna

机译:反射镜天线的镜面精度测量装置和镜面控制系统

摘要

Radiation field distributions of all mirror panels composing a main reflector are measured and held in advance, radiation field distributions of a reflector antenna having the main reflector are measured by transmitting a radio wave from a collimation antenna arranged at a prescribed distance from the reflector antenna to the reflector antenna while changing an attitude of the reflector antenna, complex excitation coefficients of each mirror panel are calculated from the radiation field distributions of the mirror panels, the radiation field distributions of the reflector antenna and the attitudes of the reflector antenna, and mirror surface accuracy of the main reflector is calculated from the complex excitation coefficients of the mirror panels.
机译:预先测量并保持构成主反射器的所有反射镜面板的辐射场分布,通过将来自布置在距反射器天线预定距离的准直天线的无线电波发射到主反射器,来测量具有主反射器的反射器天线的辐射场分布。在改变反射器天线的姿态的同时,根据反射镜面板的辐射场分布,反射器天线的辐射场分布以及反射器天线的姿态和镜面,计算出每个反射镜面板的复数激励系数。根据反射镜板的复数激发系数计算主反射镜的精度。

著录项

  • 公开/公告号US6661384B2

    专利类型

  • 公开/公告日2003-12-09

    原文格式PDF

  • 申请/专利权人 MITSUBISHI DENKI KABUSHIKI KAISHA;

    申请/专利号US20020167417

  • 发明设计人 TOMOHIRO MIZUNO;

    申请日2002-06-13

  • 分类号G01R291/00;

  • 国家 US

  • 入库时间 2022-08-21 23:12:30

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