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Mirror surfaces precisely ion - measuring device and the mirror surfaces control system of a reflector antenna

机译:镜面精密离子测量装置和反射镜天线的镜面控制系统

摘要

Mirror surfaces precisely ion - measuring device of a reflector antenna, wherein the mirror surfaces precision of a reflector antenna (1) is measured, the one of a plurality of mirror panels (5a) assembled main reflector (5) has,characterized bya transmitting antenna (16), which in a predetermined distance from the reflector antenna (1) is arranged;a radiation field distribution - measuring device (7) for measuring the radiation field distribution of the reflector antenna for the given distance of the transmitting antenna (16) with simultaneous control of the position of the reflector antenna (1);a mirror panel radiation field distribution - memory means (17) for storing the panel radiation field distribution of each mirror panel (5a) of the main reflector (5) as measured data;an excitation coefficient - calculating means (18) for calculating of complex excitation coefficients of each mirror panel of the main reflector according to the radiation field distribution - measuring device (7) measured radiation field distribution of the reflector antenna (1), which in the mirror plate radiation field distribution - memory means (17), which are held in the panel radiation field distribution of the mirror plate and a antennas position signal, which the position of the reflector antenna according to the control by means of the radiation field distribution - measuring device; anda mirror surfaces precision - calculating means (19) for calculating the mirror surfaces error each mirror panel and the mirror surfaces precision of the main reflector (5) in..
机译:反射镜天线的镜面精确离子测量装置,其中测量反射镜天线(1)的镜面精度,组装的主反射镜(5)的多个镜面板(5a)中的一个具有发射天线的特征(16),其布置在距反射器天线(1)预定距离处;辐射场分布-测量装置(7),用于在给定发射天线(16)距离下测量反射器天线的辐射场分布同时控制反射器天线(1)的位置;镜面板辐射场分布-存储装置(17),用于存储主反射器(5)的每个镜面板(5a)的面板辐射场分布作为测量数据激发系数计算装置(18),用于根据辐射场分布测定装置(7)计算主反射镜的各镜面板的复数激发系数。 )测量反射镜天线(1)的辐射场分布,它在镜板的辐射场分布中-存储装置(17),它们保存在镜板的面板辐射场分布和天线位置信号中,其位置根据辐射场分布测量装置的控制,反射天线的结构;镜面精度-计算装置(19),用于计算每个镜板的镜面误差和主反射器(5)的镜面精度。

著录项

  • 公开/公告号DE10238588B4

    专利类型

  • 公开/公告日2006-07-13

    原文格式PDF

  • 申请/专利权人 MITSUBISHI DENKI K.K. TOKYO JP;

    申请/专利号DE2002138588

  • 发明设计人 MIZUNO TOMOHIRO TOKIO/TOKYO JP;

    申请日2002-08-22

  • 分类号H01Q3/20;H01Q19/18;

  • 国家 DE

  • 入库时间 2022-08-21 21:21:06

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