首页> 外国专利> Mirror surfaces precisely ion - measuring device and the mirror surfaces control system of a reflector antenna

Mirror surfaces precisely ion - measuring device and the mirror surfaces control system of a reflector antenna

机译:镜面精密离子测量装置和反射镜天线的镜面控制系统

摘要

Radiation field distributions of all a main reflector (1), which forms the mirror plates (5a) are measured and stored in advance, radiation field distributions of a reflector antenna (1), which has the main reflector (5) are measured by sending a radio wave of a collimation antenna (16), which in a predetermined distance from the reflector antenna (1) is arranged is to be of the reflector antenna with simultaneous change in a position of the reflector antenna, complex excitation coefficients of each mirror panel from the radiation field distributions of the mirror plates in the radiation field distributions of the reflector antenna and the layers of the reflector antenna are calculated and the mirror surfaces precision of the main reflector is made of the complex excitation coefficients of the mirror panels calculated.
机译:预先测量并存储构成镜板(5a)的所有主反射器(1)的辐射场分布,通过发送来测量具有主反射器(5)的反射器天线(1)的辐射场分布。准直天线(16)的无线电波在反射器天线(1)的预定距离内布置,该无线电波将是反射器天线的,同时反射器天线的位置同时变化,每个镜面板的复数激励系数根据反射镜板的辐射场分布,计算出反射镜天线和反射镜天线各层的辐射场分布,并由计算出的反射镜板的复数激发系数来确定主反射镜的镜面精度。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号