首页> 外国专利> FABRICATION OF FILM BULK ACOUSTIC RESONATORS ON SILICON LESS THAN110GREATER THAN WAFERS USING CRYSTAL-ORIENTATION-DEPENDENT ANISOTROPIC ETCHING

FABRICATION OF FILM BULK ACOUSTIC RESONATORS ON SILICON LESS THAN110GREATER THAN WAFERS USING CRYSTAL-ORIENTATION-DEPENDENT ANISOTROPIC ETCHING

机译:晶体取向依赖性各向异性刻蚀法在硅片上(硅片上)制造出比硅脂少的薄膜散装声谐振器

摘要

A film bulk acoustic resonator formed on a substrate includes a layer of piezoelectric material having a first major surface, and a second major surface sandwiched between a first conductive and a second conductive layer. The substrate on which the film bulk acoustic resonator is formed has an opening therein which exposes the first conductive layer of the film bulk acoustic resonator. The opening is substantially in the shape of a parallelogram having a first pair of parallel sides and a second pair of parallel sides. One of the first pair of parallel sides makes an angle at other than 90 degrees with one of the second pair of parallel sides.
机译:形成在基板上的薄膜压电谐振器包括具有第一主表面和夹在第一导电层和第二导电层之间的第二主表面的压电材料层。在其上形成薄膜压电谐振器的基板上具有开口,该开口暴露薄膜压电谐振器的第一导电层。开口基本上呈具有第一对平行边和第二对平行边的平行四边形形状。第一对平行侧中的一个与第二对平行侧中的一个成90度以外的角度。

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