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BUFFER CIRCUIT HAVING REDUCED LEAKAGE CURRENT AND METHOD OF REDUCING LEAKAGE CURRENT IN A FIELD PROGRAMMABLE DEVICE

机译:具有减小的漏电流的缓冲电路和减小现场可编程设备中的漏电流的方法

摘要

A technique for reducing leakage current in static CMOS devices by adding additional transistors in series between selected inverters or logic gates and ground or power. NMOS and PMOS transistors are added to selected buffers comprised of two inverters in series. The PMOS transistor is connected between the first inverter and power and the NMOS transistor is connected between the second inverter and ground. The added transistors are controlled by a memory cell to be on when the buffer is being used and off when the buffer is unused. Alternatively, no PMOS transistor is added and an existing PMOS transistor of the first inverter is manufactured to sit in a Vgg well. The same techniques are employed with selected buffer pairs and logic gates.
机译:一种通过在选定的反相器或逻辑门与地或电源之间串联添加额外的晶体管来减少静态CMOS器件中泄漏电流的技术。 NMOS和PMOS晶体管被添加到由两个串联的反相器组成的选定缓冲器中。 PMOS晶体管连接在第一反相器和电源之间,而NMOS晶体管连接在第二反相器和地之间。当使用缓冲器时,添加的晶体管由存储单元控制为导通,而当缓冲器未使用时,其关闭。可替代地,不添加PMOS晶体管,并且将第一反相器的现有PMOS晶体管制造为位于V gg 阱中。选定的缓冲器对和逻辑门采用相同的技术。

著录项

  • 公开/公告号EP1374402A1

    专利类型

  • 公开/公告日2004-01-02

    原文格式PDF

  • 申请/专利权人 XILINX INC.;

    申请/专利号EP20020721095

  • 发明设计人 KAVIANI ALIREZA S.;

    申请日2002-02-20

  • 分类号H03K19/00;H03K19/177;

  • 国家 EP

  • 入库时间 2022-08-21 22:54:14

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