首页> 外国专利> Semiconductor manufacturing device equipped with sensing device for wafer's teaching status and using method the same device

Semiconductor manufacturing device equipped with sensing device for wafer's teaching status and using method the same device

机译:配备有用于晶片的示教状态的感测装置的半导体制造装置及其使用方法

摘要

PURPOSE: Semiconductor manufacturing equipment having an apparatus for sensing the teaching status of wafer and its method are provided to be capable of checking the teaching state of a flat zone wafer at any time under a predetermined process. CONSTITUTION: A semiconductor manufacturing equipment includes a space change unit(120) having a sensing device for wafer's teaching status which senses whether a flat zone wafer(10) is rotated, or not. The sensing device for wafer's teaching status includes a light emitting and receiving sensor support part(210) spaced apart from each other, a light emitting sensor part installed at the light emitting sensor support part, and a light receiving sensor part installed at the light receiving sensor support part. The sensing device for wafer's teaching status further includes an output part(230) for displaying whether the light transmitted from the light emitting sensor part is detected by the light receiving sensor part, or not.
机译:目的:提供具有用于感测晶片的示教状态的装置的半导体制造设备及其方法,以能够在预定工艺下随时检查平坦区晶片的示教状态。构成:一种半导体制造设备,包括一个空间变化单元(120),该空间变化单元具有一个用于晶片示教状态的传感装置,用于检测平坦区域晶片(10)是否旋转。用于晶片的示教状态的感测装置包括彼此间隔开的发光和接收传感器支撑部分(210),安装在发光传感器支撑部分处的发光传感器部分以及安装在光接收处的受光传感器部分传感器支撑部分。用于晶片的示教状态的感测装置还包括输出部分(230),用于显示从发光传感器部分透射的光是否被光接收传感器部分检测到。

著录项

  • 公开/公告号KR20040041786A

    专利类型

  • 公开/公告日2004-05-20

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号KR20020069663

  • 发明设计人 KANG HO GYEONG;

    申请日2002-11-11

  • 分类号H01L21/68;

  • 国家 KR

  • 入库时间 2022-08-21 22:49:02

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