首页> 外国专利> RADIATION SENSITIVE RESIST COMPOSITION USEFUL AS AN ACID-AMPLIFIED NON-POLYMERIC RESIST MATERIAL, WHICH COMPRISES A COMPOUND HAVING A SPECIFIC CHEMICAL STRUCTURE AND AN ACID OR BASE GENERATOR

RADIATION SENSITIVE RESIST COMPOSITION USEFUL AS AN ACID-AMPLIFIED NON-POLYMERIC RESIST MATERIAL, WHICH COMPRISES A COMPOUND HAVING A SPECIFIC CHEMICAL STRUCTURE AND AN ACID OR BASE GENERATOR

机译:辐射敏感抗蚀剂组合物,用作酸增强的非聚合物抗蚀剂材料,它包含具有特定化学结构的化合物和酸或碱生成剂

摘要

PURPOSE: Provided are a radiation sensitive composition that is sensitive not only to ultraviolet rays such as i-rays and g-rays but also to radiation such as visible lights, excimer lasers from KrF, etc., electron beams, X-rays and ion beams, and a simple method of producing a non-polymeric radiation sensitive resist composition that exhibits a high sensitivity, a high resolution, a high heat resistance and a good solubility to solvent. CONSTITUTION: The resist composition comprises at least one resist compound satisfying all the following requirements (a) to (f): (a) containing at least one acid-dissociating functional group in molecule thereof, (b) containing at least one kind of functional group selected from the group consisting of urea group, urethane group, amido group and imido group in a molecule thereof, (c) having a molecular weight of 500 to 5,000, (d) having a branched structure, (e) satisfying the formula: 3=F=5, wherein F is represented by (number of total atoms)/(number of total carbon atoms-number of total oxygen atoms), and (f) having a nitrogen content of 1 to 20% by mass; and at least one acid or base generator capable of directly or indirectly generating an acid or a base by exposure to radiation selected from the group consisting of visible lights, ultraviolet rays, excimer lasers, electron beams, X-rays and ion beams, wherein the branched structure is a chemical structure satisfying at least one of the following requirements (1) to (4): (1) having a tertiary carbon atom or a tertiary nitrogen atom which is not included in a cyclic structure; (2) having a quaternary carbon atom; (3) having at least one aromatic ring or aliphatic ring having three or more substituent groups; and (4) having a tertiary phosphorus atom, and wherein the resist compound satisfying all the requirements (a) to (e) has at least one acid-dissociating functional group in each of branched molecular chains thereof, the branched molecular chains each having at least one functional group selected from the group consisting of urea group, urethane group, amido group and imido group.
机译:目的:提供一种辐射敏感性组合物,其不仅对诸如i射线和g射线的紫外线敏感,而且对诸如可见光,来自KrF的准分子激光,电子束,X射线和离子之类的辐射敏感。光束和生产非聚合物辐射敏感性抗蚀剂组合物的简单方法,该组合物表现出高灵敏度,高分辨率,高耐热性和对溶剂的良好溶解性。组成:抗蚀剂组合物包含至少一种满足以下所有要求(a)至(f)的抗蚀剂化合物:(a)在其分子中包含至少一个酸解离官能团,(b)包含至少一种官能团选自分子中的脲基,氨基甲酸酯基,酰胺基和酰亚胺基的基团;(c)分子量为500至5,000,(d)具有支链结构,(e)满足下式: 3≤F≤5,其中,F由(总原子数)/(总碳原子数-总氧原子数)表示,(f)的氮含量为1〜20质量%。至少一种能通过暴露于选自可见光,紫外线,准分子激光器,电子束,X射线和离子束的辐射中而直接或间接产生酸或碱的酸或碱产生剂,其中支链结构是满足以下条件(1)〜(4)中的至少一项的化学结构:(1)具有不包含在环状结构中的叔碳原子或叔氮原子的化学结构。 (2)具有季碳原子; (3)具有至少一个具有三个或更多个取代基的芳环或脂族环; (4)具有叔磷原子的化合物,其中,满足(a)〜(e)的全部条件的抗蚀剂化合物在其支链分子链的每一个中具有至少一个酸解离性官能团,所述支链分子链分别具有选自脲基,氨基甲酸酯基,酰胺基和酰亚胺基的至少一种官能团。

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