首页> 外国专利> ANTIREFLECTIVE MATERIAL, SUBSTRATE HAVING ANTIREFLECTIVE LAYER OBTAINED FROM THE ANTIREFLECTIVE MATERIAL, AND PATTERN FORMATION METHOD USING THE ANTIREFLECTIVE MATERIAL TO IMPROVE ETCHING SELECTIVITY AND TO OBTAIN VERTICAL RESIST PATTERN

ANTIREFLECTIVE MATERIAL, SUBSTRATE HAVING ANTIREFLECTIVE LAYER OBTAINED FROM THE ANTIREFLECTIVE MATERIAL, AND PATTERN FORMATION METHOD USING THE ANTIREFLECTIVE MATERIAL TO IMPROVE ETCHING SELECTIVITY AND TO OBTAIN VERTICAL RESIST PATTERN

机译:抗反射材料,具有从抗反射材料获得的抗反射层的基质,以及使用抗反射材料的图案形成方法,以改善刻蚀的选择性并获得垂直抗蚀剂图案

摘要

PURPOSE: An antireflective material, a substrate having an antireflective layer obtained from the antireflective material and a pattern formation method using the antireflective material are provided, to obtain an excellent antireflective effect to the exposure using the light having a short wavelength and a high etching selectivity and to allow a vertical resist pattern to be formed on a photoresist layer on the antireflective layer. CONSTITUTION: The antireflective material comprises a polymer compound having a repeating unit represented by the formula 1, wherein R1 is a monovalent organic group having a crosslinking group; R2 is a monovalent organic group having a light absorbing group; R3 is a monovalent group having at least one functional group selected from carbonyl, ester, a lactone, amide, ether and nitrile; 0a11, 0b11, 0c11, and 0.5=a1+b1+c1=1; R4, R5 and R6 are H, OH, a C1-C6 alkyl group, a C6-C10 aryl group or a C1-C6 fluorinated alkyl group; and m, n and p are 0 or 1. Also the antireflective material comprises a polymer compound having a repeating unit represented by the formula 2 and a polymer compound having a repeating unit represented by the formula 3, wherein 0a21, 0b21, and 0.5= a2+b2=1, and 0a31, 0c21, and 0.5=a3+c2=1.
机译:用途:提供抗反射材料,具有由抗反射材料获得的抗反射层的基板以及使用该抗反射材料的图案形成方法,以利用短波长和高蚀刻选择性的光对曝光获得优异的抗反射效果。并允许在抗反射层上的光致抗蚀剂层上形成垂直抗蚀剂图案。组成:该抗反射材料包括具有式1表示的重复单元的高分子化合物,其中R 1是具有交联基团的一价有机基团; R 2为具有吸光基团的一价有机基团。 R3是具有至少一个选自羰基,酯,内酯,酰胺,醚和腈的官能团的一价基团; 0

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