首页> 外国专利> METHOD FOR FORMING THIN FILM PATTERN, METHOD FOR FABRICATING DEVICE, ELECTRICAL OPTICAL APPARATUS AND ELECTRONIC INSTRUMENT TO CONTROL DEFECT LIKE SHORT CIRCUIT

METHOD FOR FORMING THIN FILM PATTERN, METHOD FOR FABRICATING DEVICE, ELECTRICAL OPTICAL APPARATUS AND ELECTRONIC INSTRUMENT TO CONTROL DEFECT LIKE SHORT CIRCUIT

机译:形成薄膜图案的方法,制造装置的方法,电光学设备和电子仪器以控制类似的短路电路

摘要

PURPOSE: A method for forming a thin film pattern is provided to control a defect like a short circuit by disposing functional liquid on a substrate. CONSTITUTION: A bank is formed on a substrate according to a thin film pattern(S1). The residue between the banks is eliminated(S2-1). Functional liquid is disposed between the banks from which the residue is removed. The residue removing process is to eliminate the residue in the bottom part between the banks. The residue removing process includes a plasma treatment process using predetermined process gas and/or a light irradiation treatment process.
机译:目的:提供一种用于形成薄膜图案的方法,以通过将功能液体布置在基板上来控制诸如短路之类的缺陷。组成:根据薄膜图案在基板上形成堤(S1)。排之间的残留物被消除(S2-1)。将功能性液体置于去除残留物的堤之间。去除残留物的过程是消除排之间底部的残留物。残留物去除处理包括使用预定处理气体的等离子体处理处理和/或光照射处理处理。

著录项

  • 公开/公告号KR20040086601A

    专利类型

  • 公开/公告日2004-10-11

    原文格式PDF

  • 申请/专利权人 SEIKO EPSON CORPORATION;

    申请/专利号KR20040021165

  • 发明设计人 HIRAI TOSHIMITSU;

    申请日2004-03-29

  • 分类号H01L21/28;

  • 国家 KR

  • 入库时间 2022-08-21 22:47:50

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