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WAFER DRY APPARATUS FOR DRYING FULLY WAFER AFTER WAFER CLEANING PROCESS

机译:晶圆干燥设备,用于在晶圆清洗过程后完全干燥晶圆

摘要

PURPOSE: A wafer dry apparatus is provided to dry uniformly the entire surface of a wafer by uniformly supplying IPA vapor to an upper part and a lower part of a dry bath. CONSTITUTION: A wafer(20) is loaded on a dry bath(11). A vapor generator(12) is used for generating IPA vapor. A first diffuser(11e-1) is arranged at one side of the dry bath to uniformly inject the IPA vapor onto the wafer. A plurality of vapor pressure control valves(14-1,14-2) are installed between the first diffuser and the vapor generator to control the amount of the IPA vapor. A vent pump(13) is connected between the vapor pressure control valves and the first diffuser. A plurality of speed control valves(15-1,15-2) are used for controlling vapor speed. A second diffuser(11e-2) is opposite to the second diffuser and the wafer is positioned therebetween. An additional vapor pressure valve is installed between the second diffuser and the vapor generator to control the amount of the vapor. An additional speed control valve is installed between the second diffuser and the vent pump to control the vapor speed.
机译:目的:提供一种晶片干燥装置,其通过将IPA蒸气均匀地供应到干浴的上部和下部来均匀地干燥晶片的整个表面。组成:将晶片(20)放在干浴(11)上。蒸气发生器(12)用于产生IPA蒸气。第一扩散器(11e-1)布置在干浴的一侧,以将IPA蒸气均匀地注入到晶片上。在第一扩散器和蒸气发生器之间安装有多个蒸气压力控制阀(14-1,14-2),以控制IPA蒸气的量。在蒸气压控制阀与第一扩散器之间连接有排气泵(13)。多个速度控制阀(15-1,15-2)用于控制蒸气速度。第二扩散器(11e-2)与第二扩散器相对并且晶片位于它们之间。在第二扩散器和蒸汽发生器之间安装了附加的蒸汽压力阀,以控制蒸汽量。在第二扩散器和排气泵之间安装了一个附加的速度控制阀,以控制蒸汽速度。

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